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bbf-melt@2019-06-11



  module bbf-melt {

    yang-version 1.1;

    namespace "urn:bbf:yang:bbf-melt";

    prefix bbf-melt;

    include bbf-melt-base;
    include bbf-melt-pointers;
    include bbf-melt-pmd;
    include bbf-melt-pmd-control-body;
    include bbf-melt-pmd-status-body;
    include bbf-melt-pmd-profiles;
    include bbf-melt-pmd-profile-body;
    include bbf-melt-processing-profiles;
    include bbf-melt-processing-profile-body;
    include bbf-melt-result-parameters;
    include bbf-melt-pmd-measurement-parameter-body;
    include bbf-melt-pmd-reporting-parameter-body;
    include bbf-melt-processing-derived-parameter-body;

    organization
      "Broadband Forum <https://www.broadband-forum.org>
Common YANG Work Area";

    contact
      "Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN";

    description
      "This module contains a collection of YANG definitions for
supporting Metallic Line Test (MELT) as defined in ITU G.996.2.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.";

    revision "2019-06-11" {
      description
        "Amendment 2.
* Approval Date:    2019-06-11
* Publication Date: 2019-06-11.";
      reference
        "TR-355a2: YANG Modules for FTTdp Management
        	  <https://www.broadband-forum.org/technical/download/
        		 TR-355_Amendment-2.pdf>";

    }

    revision "2018-10-01" {
      description
        "Amendment 1.
* Approval Date:    2018-10-01
* Publication Date: 2018-10-01.";
      reference
        "TR-355a1: YANG Modules for FTTdp Management
        	  <https://www.broadband-forum.org/technical/download/
        		 TR-355_Amendment-1.pdf>";

    }

    revision "2017-11-27" {
      description
        "Corrigendum 2 (fixes to the previous revision).
* Approval Date:    see revision date above.
* Publication Date: 2018-01-19.";
      reference
        "TR-355c2: YANG Modules for FTTdp Management
        	  <https://www.broadband-forum.org/technical/download/
        		 TR-355_Corrigendum-2.pdf>";

    }

    revision "2016-07-18" {
      description
        "Initial revision.
* Approval Date:    see revision date above.
* Publication Date: 2016-08-05.";
      reference
        "TR-355: YANG Modules for FTTdp Management
        	<https://www.broadband-forum.org/technical/download/
        		 TR-355.pdf>";

    }


    // features

    feature melt-p {
      description
        "Indicates support for Metallic Line Test (MELT) processing
profiles (MELT-P).";
      reference
        "ITU-T G.996.2 annex F";

    }

    feature melt-pmd-reporting-parameter-reliability {
      description
        "Indicates support for reporting the reliability of the
Physical Medium Dependent (PMD) reporting parameters.";
    }

    feature melt-pmd-measurement-parameter-reliability {
      description
        "Indicates support for reporting the reliability of the
Physical Medium Dependent (PMD) measurement parameters.";
    }

    feature melt-processing-derived-parameter-reliability {
      description
        "Indicates support for reporting the reliability of the
processing derived parameters.";
    }

    // identities

    identity measurement-class {
      base 
      description
        "Base identity for defining the various measurements";
    }

    identity melt-cdcr {
      base measurement-class;
      description
        "The 4-element DC resistance with controlled metallic
voltage";
      reference
        "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-xx)";

    }

    identity melt-cc {
      base measurement-class;
      description
        "The 3-element capacitance with controlled metallic voltage";
      reference
        "ITU-T G.996.2 clause E.2.3.4 (MELT-CC-xx)";

    }

    identity melt-fvdc {
      base measurement-class;
      description "The foreign DC voltage";
      reference
        "ITU-T G.996.2 clause E.2.3.5 (MELT-FVDC-xx)";

    }

    identity melt-fvac {
      base measurement-class;
      description "The foreign AC voltage";
      reference
        "ITU-T G.996.2 clause E.2.3.5 (MELT-FVAC-xx)";

    }

    identity melt-hc {
      base measurement-class;
      description "The loop capacitance";
      reference
        "ITU-T G.996.2 clause E.2.3.6 (MELT-HC-xx)";

    }

    identity melt-hdcr {
      base measurement-class;
      description
        "The loop resistance with high metallic voltage";
      reference
        "ITU-T G.996.2 clause E.2.3.7 (MELT-HDCR-xx)";

    }

    identity melt-ca {
      base measurement-class;
      description
        "The 3-element complex admittance with controlled
metallic voltage.";
      reference
        "ITU-T G.996.2 clause E.2.3.9 (MELT-CAx-xx)";

    }

    identity melt-ha {
      base measurement-class;
      description
        "The loop complex admittance with high
metallic voltage.";
      reference
        "ITU-T G.996.2 clause E.2.3.10 (MELT-HAx-xx)";

    }

    // typedefs
    typedef pmd-function {
      type enumeration {
        enum "measurement" {
          value 1;
          description
            "Triggers the Metallic Line Test Physical Medium Dependent
(MELT-PMD) to start the test or tests specified by the
measurement class (MELT-MCLASS).";
        }
        enum
          "pair-identification-tone-generation" {
          value 2;
          description
            "Triggers the Metallic Line Test Physical Medium Dependent
(MELT-PMD) to start a Pair Identification Tone (PIT)
generation.";
        }
      }
      description "The MELT PMD function.";
    }

    typedef pmd-profile-ref {
      type leafref {
        path "/bbf-melt:melt/bbf-melt:profiles/bbf-melt:pmd-profile/bbf-melt:name";
      }
      description
        "Used to reference a Physical Medium Dependent (PMD) profile";
    }

    typedef pmd-result {
      type enumeration {
        enum
          "no-measurement-results-available" {
          value 0;
          description
            "No measurement results are available when no mesurement
has been performed yet or after measurement results have
been deleted.";
        }
        enum
          "measurement-failed-results-invalid" {
          value 1;
          description
            "The measurement results are invalid after the most recent
measurement failed.";
        }
        enum
          "measurement-succeeded-results-valid" {
          value 2;
          description
            "The measurement results are valid after the most recent
measurement succeeded.";
        }
      }
      description
        "The overall results of the Physical Medium Dependent (PMD)
measurement.";
      reference
        "ITU-T G.996.2 clause E.3.4";

    }

    typedef four-element-dc-resistance {
      type uint32 {
        range "0..10000000";
      }
      units "1 ohm";
      description
        "The 4-element DC resistances, RTR (Tip-to-Ring), RRT
(Ring-to-Tip), RTG (Tip-to-Ground), and RRG (Ring-to-Ground),
shall be represented in linear format. The range of valid
values is from 0 to 10 Mohms with a granularity of 1 ohm.";
      reference
        "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-TR, MELT-CDCR-RT,
        MELT-CDCR-TG, MELT-CDCR-RG)";

    }

    typedef three-element-capacitance {
      type int32 {
        range "-20000..50000";
      }
      units "0.1 nF";
      description
        "The 3-element capacitances, CTR (Tip-to-Ring), CTG
(Tip-to-Ground), and CRG (Ring-to-Ground), shall be represented
in linear format. The range of valid values is from -2 to 5 uF
with a granularity of 0.1 nF.";
      reference
        "ITU-T G.996.2 clause E.2.3.4 (MELT-CC-TR, MELT-CC-TG,
        MELT-CC-RG)";

    }

    typedef foreign-dc-voltage {
      type int16 {
        range "-3500..3500";
      }
      units "100 mV";
      description
        "The range of valid values for the foreign DC voltages,
VTR-DC (Tip-to-Ring), VTG-DC (Tip-to-Ground), and VRG-DC
(Ring-to-Ground) is from -350 to 350V. The foreign DC voltage
shall be represented in linear format with a granularity of
100 mV.

The reported DC voltage polarity is defined with respect to
ground for the VTG-DC and VRG-DC measurements and returns a
positive result for the VTR-DC measurement if the tip wire
is more positive than the ring wire. ";
      reference
        "ITU-T G.996.2 clause E.2.3.5 (MELT-FVDC-TR, MELT-FVDC-TG,
        MELT-FVDC-RG)";

    }

    typedef foreign-ac-voltage {
      type uint16 {
        range "0..2500";
      }
      units "100 mVrms";
      description
        "The range of valid values for the foreign AC voltages
VTR-AC (Tip-to-Ring), VTG-AC (Tip-to-Ground), and VRG-AC
(Ring-To-Ground) is from 0 to 250Vrms. The foreign AC voltage
shall be represented in linear format with a granularity of
100 mV.";
      reference
        "ITU-T G.996.2 clause E.2.3.5 (MELT-FVAC-TR, MELT-FVAC-TG,
        MELT-FVAC-RG)";

    }

    typedef foreign-ac-voltage-frequency {
      type uint16 {
        range "100..900";
      }
      units "0.1 Hz";
      description
        "The range of valid values for the foreign AC voltage FTR-AC
(Tip-to-Ring), FTG-AC (Tip-to-Ground), and FRG-AC
(Ring-To-Ground) is from 10 to 90 Hz with a granularity
of 0.1 Hz.";
      reference
        "ITU-T G.996.2 clause E.2.3.5 (MELT-FVACF-TR, MELT-FVACF-TG,
        MELT-FVACF-RG)";

    }

    typedef loop-resistance {
      type uint32 {
        range "0..10000000";
      }
      units "1 ohm";
      description
        "The loop resistances RTF-HV (Tip-to-Ring) and RRT-HV
(Ring-to-Tip) shall be represented in linear format. The range
of valid values is from 0 to 10 Mohms with a granularity of 1
ohm. The RTR-HV and RRT-HV values of the loop resistance with
high metallic voltage test are the total resistances measured.
The RTR and RRT values obtained from the 3-element resistance
with controlled metallic voltage test are not subtracted from
the results.";
      reference
        "ITU-T G.996.2 clause E.2.3.7 (MELT-HDCR-TR, MELT-HDCR-RT)";

    }

    typedef dc-test-voltage {
      type int16 {
        range "-1500..1500";
      }
      units "0.1 V";
      description
        "The test voltages for the measurement of the 4-element DC
resistance, VDCTR (Tip-to-Ring), VDCRT (Ring-to-Tip), VDCTG
(Tip-to-Ground), and VDCRG (Ring-to-Ground), shall be
represented in linear format. The range of valid values is from
-150 V to +150 V with a granularity of 0.1 V.";
      reference
        "ITU-T G.996.2 clause E.2.3.2 (MELT-CDCV-TR, MELT-CDCV-RT,
        MELT-CDCV-TG, MELT-CDCV-RG)";

    }

    typedef test-current {
      type int32 {
        range "-1000000..1000000";
      }
      units "1 uA";
      description
        "The test currents for the measurement of the 4-element DC
resistance, IDCTR (Tip-to-Ring), IDCRT (Ring-to-Tip),
IDCTG (Tip-to-Ground), and IDCRG (Ring-to-Ground), shall be
represented in linear format. The range of valid values is from
-1 A to +1 A with a granularity of 1 uA.";
      reference
        "ITU-T G.996.2 clause E.2.3.3 (MELT-CDCI-TR, MELT-CDCI-RT,
        MELT-CDCI-TG, MELT-CDCI-RG)";

    }

    typedef loop-resistance-test-voltage {
      type int16 {
        range "-1500..1500";
      }
      units "0.1 V";
      description
        "The test voltages for the measurement of the loop resistance
with a high metallic voltage, VDCHTR (Tip-to-Ring) and
VDCHRT (Ring-to-Tip) shall be represented in linear format.
The range of valid values is from -150 V to +150 V with a
granularity of 0.1 V.";
      reference
        "ITU-T G.996.2 clause E.2.3.8 (MELT-HDCV-TR, MELT-HDCV-RT)";

    }

    typedef measurement-voltage {
      type uint16 {
        range "0..1500";
      }
      units "0.1 V";
      description
        "The range of valid values for the AC voltages VACTR-CC
(Tip-to-Ring), VACTG-CC (Tip-to-Ground), and VACRG-CC
(Ring-to-Ground) for the 3-element capacitance test with
a controlled metallic voltage is from 0 V rms to 150 V rms.
The values shall be represented in linear format with a
granularity of 0.1 V.

The range of valid values for the AC voltage VACTR-HC for the
loop capacitance test with a high metallic voltage is from 0
Vrms to 150 Vrms. The values shall be represented in linear
format with a granularity of 0.1 V.

The range of valid values for the AC voltages VACTR-CA,
VACTG-CA, and VACRG-CA for the 3-element complex admittance
test with a controlled metallic voltage is from 0 Vrms to 150
Vrms. The values shall be represented in linear format with a
granularity of 0.1 V.

The range of valid values for the AC voltage VACTR-HA for the
loop complex admittance test with a high metallic voltage is
from 0 V rms to 150 V rms. The values shall be represented in
linear format with a granularity of 0.1 V.";
      reference
        "ITU-T G.996.2 clauses E.2.3.11 (MELT-ACV-CC-TR,
        MELT-ACV-CC-TG, MELT-ACV-CC-RG); E.2.3.12 (MELT-ACV-HC-TR);
        E.2.3.13 (MELT-ACV-CA-TR, MELT-ACV-CA-TG, MELT-ACV-CA-RG);
        E.2.3.14 (MELT-ACV-HA-TR); and E.2.2.3 (MELT-HCA-V)";

    }

    typedef complex-admittance {
      type uint32 {
        range "1..1000000";
      }
      units "0.1 uSiemens";
      description
        "The range of valid values for the 3-element complex
conductances and susceptances, GTR and BTR (Tip-to-Ring);
GTG and BTG (Tip-to-Ground); and GRG and BRG (Ring-to-Ground)
is from 0.1 uSiemens to 0.1 Siemens. The values shall be
represented in linear format with a granularity of 0.1
uSiemens.

NOTE - The linear format is chosen for simplicity reason and
does not imply any future accuracy requirements.";
      reference
        "ITU-T G.996.2 clause E.2.3.9 (MELT-CAG-TR, MELT-CAB-TR,
        MELT-CAG-TG, MELT-CAB-TG, MELT-CAG-RG, MELT-CAB-RG)";

    }

    typedef loop-complex-admittance {
      type uint32 {
        range "1..1000000";
      }
      units "0.1 uSiemens";
      description
        "The range of valid values for the 3-element complex
conductance and susceptance GTR,HV and BTR,HV (Tip-to-Ring) is
from 0.1 uSiemens to 0.1 Siemens. The values shall be
represented in linear format with a granularity of 0.1
uSiemens. The GTR,HV and BTR,HV values of the loop complex
admittance with high metallic voltage test are the total
conductance and susceptance measured. The GTR and BTR values
obtained from the 3-element complex admittance with controlled
metallic voltage test are not subtracted from the results.

NOTE - The linear format is chosen for simplicity reason and
does not imply any future accuracy requirements.";
      reference
        "ITU-T G.996.2 clause E.2.3.10 (MELT-HAG-TR, MELT-HAB-TR)";

    }

    // groupings
    grouping melt-pmd-control {
      description
        "Defines the parameters contained in the Physical Medium
Dependent (PMD) control object.";
      choice pmd-functions {
        default "all-functions-disable";
        status deprecated;
        description
          "Options for enabling/disabling Physical Medium Dependent
(PMD) functions.";
        case all-functions-disable {
          status deprecated;
          leaf all-functions-disable {
            type empty;
            status deprecated;
            description
              "Disable all Physical Medium Dependent (PMD) control
functions.";
          }
        }  // case all-functions-disable

        case measurement-enable-c {
          status deprecated;
          leaf measurement-enable-c {
            type empty;
            status deprecated;
            description
              "Enables the test or tests specified by the measurement
class (MELT-MCLASS)";
          }
        }  // case measurement-enable-c

        case pair-identification-tone-generation-enable {
          status deprecated;
          leaf pair-identification-tone-generation-enable {
            type empty;
            status deprecated;
            description
              "Enables pair identification tone generation.";
          }
        }  // case pair-identification-tone-generation-enable
      }  // choice pmd-functions
    }  // grouping melt-pmd-control

    grouping pmd-control {
      description
        "Physical Medium Dependent (PMD) control functions.";
      leaf pmd-control {
        type enumeration {
          enum "disable" {
            value 0;
            description
              "The Metallic Line Test Physical Medium Dependent
(MELT-PMD) functionality is not configured for a
measurement or Pair Identification Tone (PIT)
generation.";
          }
          enum "enable" {
            value 1;
            description
              "The Metallic Line Test Physical Medium Dependent
(MELT-PMD) functionality is configured for a
measurement or Pair Identification Tone (PIT)
generation.";
          }
        }
        default "disable";
        description
          "This parameter configures the Metallic Line Test Physical
Medium Dependent (MELT-PMD) for a MELT measurement or Pair
Identification Tone (PIT) generation.";
      }

      action request-pmd-function-c {
        description
          "Requests to disable or enable PMD functions.";
        input {
          leaf pmd-function {
            type union {
              type enumeration {
                enum "abort" {
                  value 0;
                  description
                    "Triggers the Metallic Line Test Physical Medium
Dependent (MELT-PMD) to abort any ongoing
measurement or Pair Identification Tone (PIT)
generation.";
                }
              }
              type pmd-function;
            }
            description
              "A measurement or Pair Identification Tone (PIT)
generation is by default not triggered. A measurement or
PIT generation is triggered when the action is sent with
the appropriate function specified. One or more
measurements or PIT generations may be triggered while
the Metallic Line Test Physical Medium Dependent
(MELT-PMD) is configured 'enable', possibly with
different MELT PMD configuration parameters. If the
triggered measurement or PIT generation cannot be
executed, then the Access Node/Distribution Point Unit
(AN/DPU) Management Entitiy (ME) rejects this action and
the  MELT PMD status remains 'inactive'.";
          }
        }
      }  // rpc request-pmd-function-c
    }  // grouping pmd-control

    grouping pmd-profile {
      description
        "Defines the parameters contained in a Physical Medium Dependent
(PMD) profile.";
      leaf peak-metallic-voltage-tr {
        type uint8 {
          range "0..150";
        }
        units "1 V";
        description
          "This parameter defines the peak metallic voltage which must
not be exceeded in any active measurement applying a
metallic voltage between tip and ring in order not to
conduct current in anon-linear termination located at the
far-end during the measurement. The range of valid values is
from 0 to 150 V with a granularity of 1 V. In the case of a
test performed with a sinewave signal, it applies to the
peak of the sinewave, not to its rms value.";
        reference
          "ITU-T G.996.2 clause E.2.1.2 (MELT-PV)";

      }

      leaf pair-identification-tone-frequency {
        type uint16 {
          range "300..3400";
        }
        units "1 Hz";
        description
          "This parameter sets up frequency of the pair identification
tone as defined in clause E.1.2.1. The range of frequencies
is from 300 to 3400 Hz in granularity of 1 Hz.
The supported set of frequencies is at the vendor's
discretion.";
        reference
          "ITU-T G.996.2 clause E.2.1.4 (MELT-PIT-F)";

      }

      leaf pair-identification-tone-timeout {
        type uint16 {
          range "1..65535";
        }
        units "1 second";
        description
          "This parameter specifies the duration of the pair
identification tone. After timeout the pair identification
tone is deactivated automatically, if not deactivated
manually before (abort).";
        reference
          "ITU-T G.996.2 clause E.2.1.5 (MELT-PIT-T)";

      }

      leaf maximum-far-end-signature-conductive-voltage {
        type uint16 {
          range "0..500";
        }
        units "0.1 V";
        description
          "This parameter specifies the maximum conduction voltage
level of an expected far-end signature. It defines the
minimum metallic voltage required for all measurements with
a high metallic voltage between tip and ring in order to
conduct current in a far-end signature during the
measurement. The range of valid values is from 0 to 50 V
with a granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.1.5 (MELT-MAXFE-SCV)";

      }

      leaf minimum-far-end-signature-conductive-voltage {
        type uint16 {
          range "0..500";
        }
        units "0.1 V";
        description
          "This parameter specifies the minimum conduction voltage
level of an expected far-end signature. It defines the
maximum metallic voltage allowed for all measurements with a
controlled metallic voltage between tip and ring in order
not to conduct current in a far-end signature during the
measurement. The range of valid values is from 0 to 50 V
with a granularity of 0.1 V. In the case of a measurement
performed with a sinewave signal, it applies to the peak of
the sinewave, not to its rms value.";
        reference
          "ITU-T G.996.2 clause E.2.1.6 (MELT-MINFE-SCV)";

      }

      leaf-list measurement-class {
        type identityref {
          base measurement-class;
        }
        ordered-by user;
        description
          "This parameter defines the list of measurements to be
executed. It shall support a single measurement or a set of
MELT measurements in a consecutive manner. The measurements
of interest are selected via a flag register, or
equivalent. If no elements exist, no measurements will be
executed.";
        reference
          "ITU-T G.996.2 clause E.2.1.1 (MELT-MCLASS)";

      }

      leaf signal-frequency-for-active-ac-tests {
        type uint16 {
          range "10..1000";
        }
        units "1 Hz";
        description
          "This parameter controls the frequency used during the
3-element capacitance test, if performed with a sinewave
signal, and during the 3-element complex admittance test.
This parameter shall be represented in linear format with
values from 10 to 1000 Hz with a granularity of 1 Hz.

The supported set of frequencies is at the vendor's
discretion with an option to operate in automatic mode for
which the testing routine will select the frequency on its
own.";
        reference
          "ITU-T G.996.2 clause E.2.1.3 (MELT-AC-F)";

      }
    }  // grouping pmd-profile

    grouping processing-profile {
      description
        "Defines the parameters contained in a processing profile.";
      container loop-resistance-classification-threshold {
        description
          "This parameter defines the limits for classification of the
resistances to ground (GND) of the loop under test.

The following limit values need to be defined:
 - maximum resistance for a short-circuit to GND;
 - minimum resistance for a leakage to GND;
 - maximum resistance for a leakage to GND.

A resistance to ground measured as being:
 - Below the maximum resistance for a short circuit shall be
   interpreted as a short circuit to GND.
 - Above the maximum resistance for a short circuit and
   below the minimum resistance for a leakage shall be
   interpreted as a resistance fault to GND.
 - Above the minimum resistance for a leakage and below the
   maximum resistance for a leakage shall be interpreted as
   a leakage to GND.
 - Above the maximum resistance for a leakage shall be
   interpreted as a high impedance to GND. ";
        reference
          "ITU-T G.996.2 clause F.2.1.1 (MELT-LRC-TH)";

        leaf maximum-resistance-short-circuit-to-ground {
          type uint32;
          units "0.1 kOhm";
          description
            "The maximum resistance threshold for a short circuit to
ground.";
        }

        leaf minimum-resistance-leakage-to-ground {
          type uint32;
          units "0.1 kOhm";
          description
            "The minimum resistance threshold for a leakage to ground.";
        }

        leaf maximum-resistance-leakage-to-ground {
          type uint32;
          units "0.1 kOhm";
          description
            "The maximum resistance threshold for a leakage to ground.";
        }
      }  // container loop-resistance-classification-threshold

      container loop-parameters-per-unit-length {
        description
          "The a priori knowledge of some characteristic parameters per
Unit length of the loop under test is necessary to derive
length or distance information from the Metallic Line Test
Physical Medium Dependent (MELT-PMD) measurements. This
parameter combines the set of required loop parameters:

1) Cable characteristic capacitance per unit length between
   tip and ring. The range of valid values is from 0 to 100
   nF/km with a granularity of 0.1 nF/km.
2) Cable characteristic capacitance per unit length between
   tip and GND and ring and GND. The range of valid values
   is from 0 to 100 nF/km with a granularity of 0.1 nF/km.
3) Cable loop DC resistance per unit length (sum of both
   wires). The range of valid values is from 50 to 400
   ohm/km with a granularity of 1 ohm/km.";
        reference
          "ITU-T G.996.2 clause F.2.1.2 (MELT-LOOP-PARAMS)";

        leaf capacitance-per-unit-length-tr {
          type uint16 {
            range "0..1000";
          }
          units "0.1 nF/km";
          description
            "Cable characteristic capacitance per unit length between
tip and ring. The range of valid values is from 0 to 100
nF/km with a granularity of 0.1 nF/km.";
        }

        leaf capacitance-per-unit-length-tg-rg {
          type uint16 {
            range "0..1000";
          }
          units "0.1 nF/km";
          description
            "Cable characteristic capacitance per unit length between
tip and ground (GND) and ring and GND. The range of valid
values is from 0 to 100 nF/km with a granularity of 0.1
nF/km.";
        }

        leaf dc-resistance-per-unit-length {
          type uint16 {
            range "50..400";
          }
          units "1 ohm/km";
          description
            "Cable loop DC resistance per unit length (sum of both
wires). The range of valid values is from 50 to 400
ohm/km with a granularity of 1 ohm/km.";
        }
      }  // container loop-parameters-per-unit-length

      leaf hazardous-dc-voltage-level {
        type uint8 {
          range "0..200";
        }
        units "1 V";
        description
          "This parameter defines the level above which DC voltage
shall be identified as hazardous. The hazardous voltage
level shall be configurable between 0 and 200 V with a
granularity of 1 V.";
        reference
          "ITU-T G.996.2 clause F.2.1.3 (MELT-HDCV-L)";

      }

      leaf hazardous-ac-voltage-level {
        type uint8 {
          range "0..200";
        }
        units "1 Vrms";
        description
          "This parameter defines the level above which AC voltage
shall be identified as hazardous. The hazardous voltage
level shall be configurable between 0 and 200 Vrms with a
granularity of 1 Vrms.";
        reference
          "ITU-T G.996.2 clause F.2.1.4 (MELT-HACV-L)";

      }

      leaf foreign-emf-dc-voltage-level {
        type uint8 {
          range "0..50";
        }
        units "1 V";
        description
          "This parameter defines the level above which a DC voltage
shall be identified as a foreign Electromagnetic Field (EMF).
The foreign EMF voltage level shall be configurable between
0 and 50 V with a granularity of 1 V.";
        reference
          "ITU-T G.996.2 clause F.2.1.5 (MELT-FDCV-L)";

      }

      leaf foreign-emf-ac-voltage-level {
        type uint8 {
          range "0..50";
        }
        units "1 Vrms";
        description
          "This parameter defines the level above which an AC voltage
shall be identified as a foreign Electromagnetic Field (EMF).
The foreign EMF voltage level shall be configurable between
0 and 50 Vrms with a granularity of 1 Vrms";
        reference
          "ITU-T G.996.2 clause F.2.1.6 (MELT-FACV-L)";

      }

      leaf system-capacitance-cpe-side {
        type uint16 {
          range "0..20000";
        }
        units "0.1 nF";
        description
          "This parameter is the expected value of the system
capacitance at the Customer Premises Equipment (CPE) side as
it appears in parallel between tip and ring in a
corresponding Metallic Line Test (MELT) measurement.
A priori knowledge of this capacitance improves accuracy of
the results and offers additional degrees for
interpretation. The range of valid values is from 0 to 2 uF
with a granularity of 0.1 nF";
        reference
          "ITU-T G.996.2 clause F.2.1.7 (MELT-SYSC-CPE)";

      }
    }  // grouping processing-profile

    grouping pmd-status {
      description
        "Status parameters for the Physical Medium Dependent (PMD)
object.";
      leaf melt-status-c {
        type enumeration {
          enum "inactive" {
            value 0;
            description
              "The Metallic Line Test (MELT) functionality is
inactive.";
          }
          enum "measurement-ongoing" {
            value 1;
            description
              "The measurement is ongoing.";
          }
          enum "pit-generation-ongoing" {
            value 2;
            description
              "The Pair Identifiation Tone (PIT) is ongoing.";
          }
        }
        description
          "The status of the Metallic Line Test Physical Medium
Dependent (MELT-PMD) measurement.

Upon the MELT PMD request triggering a measurement, the
MELT PMD status shall become 'measurement-ongoing' if
the measurement is executed.

Upon the MELT PMD request triggering a Pair Identification
Tone (PIT) generation, the MELT PMD status shall become
'pit-ongoing' if the PIT generation is executed.

Upon abortion or successful completion of the measurement or
PIT generation, the MELT PMD status shall become 'inactive'
and the AN/DPU ME shall send a notification to the NMS.";
        reference
          "ITU-T G.996.2 clause E.3.3";

      }

      leaf melt-results-c {
        type pmd-result;
        description
          "The overall results of the Metallic Line Test Physical Medium
Dependent (MELT-PMD) measurement.";
        reference
          "ITU-T G.996.2 clause E.3.4";

      }

      leaf results-timestamp {
        type yang:date-and-time;
        description
          "The time stamp contains the time when results of last
measurement test were stored.";
        reference
          "ITU-T G.996.2 clause E.2.2.5";

      }
    }  // grouping pmd-status

    grouping pmd-measurement-parameters {
      description
        "Defines the Metallic Line Test Physical Medium Dependent
(MELT-PMD) measurement parameters.";
      leaf four-element-dc-resistance-tr {
        type four-element-dc-resistance;
        description
          "The 4-element DC resistance with controlled metallic
voltage, RTR (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-TR)";

      }

      leaf four-element-dc-resistance-rt {
        type four-element-dc-resistance;
        description
          "The 4-element DC resistance with controlled metallic
voltage, RRT (Ring-to-Tip)";
        reference
          "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-RT)";

      }

      leaf four-element-dc-resistance-tg {
        type four-element-dc-resistance;
        description
          "The 4-element DC resistance with controlled metallic
voltage, RTG (Tip-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-TG)";

      }

      leaf four-element-dc-resistance-rg {
        type four-element-dc-resistance;
        description
          "The 4-element DC resistance with controlled metallic
voltage, RRG (Ring-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-RG)";

      }

      leaf three-element-capacitance-tr {
        type three-element-capacitance;
        description
          "The 3-element capacitance with controlled metallic voltage,
CTR (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.4 (MELT-CC-TR)";

      }

      leaf three-element-capacitance-tg {
        type three-element-capacitance;
        description
          "The 3-element capacitance with controlled metallic voltage,
CTG (Tip-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.4 (MELT-CC-TG)";

      }

      leaf three-element-capacitance-rg {
        type three-element-capacitance;
        description
          "The 3-element capacitance with controlled metallic voltage,
CRG (Ring-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.4 (MELT-CC-RG)";

      }

      leaf foreign-dc-voltage-tr {
        type foreign-dc-voltage;
        description
          "The foreign DC voltage, VTR-DC (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.5 (MELT-FVDC-TR)";

      }

      leaf foreign-dc-voltage-tg {
        type foreign-dc-voltage;
        description
          "The foreign DC voltage, VTG-DC (Tip-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.5 (MELT-FVDC-TG)";

      }

      leaf foreign-dc-voltage-rg {
        type foreign-dc-voltage;
        description
          "The foreign DC voltage, VRG-DC (Ring-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.5 (MELT-FVDC-RG)";

      }

      leaf foreign-ac-voltage-tr {
        type foreign-ac-voltage;
        description
          "The foreign AC voltage, VTR-AC (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.5 (MELT-FVAC-TR)";

      }

      leaf foreign-ac-voltage-tg {
        type foreign-ac-voltage;
        description
          "The foreign AC voltage, VTG-AC (Tip-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.5 (MELT-FVAC-TG)";

      }

      leaf foreign-ac-voltage-rg {
        type foreign-ac-voltage;
        description
          "The foreign AC voltage, VRG-AC (Ring-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.5 (MELT-FVAC-RG)";

      }

      leaf foreign-ac-voltage-frequency-tr {
        type foreign-ac-voltage-frequency;
        description
          "The foreign AC voltage frequency for VTR-AC (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.5 (MELT-FVACF-TR)";

      }

      leaf foreign-ac-voltage-frequency-tg {
        type foreign-ac-voltage-frequency;
        description
          "The foreign AC voltage frequency for VTG-AC
(Tip-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.5 (MELT-FVACF-TG)";

      }

      leaf foreign-ac-voltage-frequency-rg {
        type foreign-ac-voltage-frequency;
        description
          "The foreign AC voltage frequency for VRG-AC
(Ring-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.5 (MELT-FVACF-RG)";

      }

      leaf loop-capacitance-hv-tr {
        type int32 {
          range "-20000..50000";
        }
        units "0.1 nF";
        description
          "The loop capacitance CTR-HV (Tip-to-Ring) shall be
represented in linear format. The range of valid values is
from -2 to 5 uF with a granularity of 0.1 nF. The CTR-HV
value of the loop capacitance with high metallic voltage test
is the total capacitance measured. The CTR value obtained
from the 3-element capacitance with controlled metallic
voltage test is not subtracted from the results.";
        reference
          "ITU-T G.996.2 clause E.2.3.6 (MELT-HV-TR)";

      }

      leaf loop-resistance-hv-tr {
        type loop-resistance;
        description
          "The loop resistance with high metallic voltage, RTR-HV
(Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.7 (MELT-HDCR-TR)";

      }

      leaf loop-resistance-hv-rt {
        type loop-resistance;
        description
          "The loop resistance with high metallic voltage, RRT-HV
(Ring-to-Tip)";
        reference
          "ITU-T G.996.2 clause E.2.3.7 (MELT-HDCR-RT)";

      }

      leaf four-element-dc-resistance-test-voltage-tr {
        type dc-test-voltage;
        description
          "The DC test voltage for the measuremnt of 4-element DC
resistance with a controlled metallic voltage VDC-TR
(Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.2 (MELT-CDCV-TR)";

      }

      leaf four-element-dc-resistance-test-voltage-rt {
        type dc-test-voltage;
        description
          "The DC test voltage for the measuremnt of 4-element DC
resistance with a controlled metallic voltage VDC-RT
(Ring-to-Tip)";
        reference
          "ITU-T G.996.2 clause E.2.3.2 (MELT-CDCV-RT)";

      }

      leaf four-element-dc-resistance-test-voltage-tg {
        type dc-test-voltage;
        description
          "The DC test voltage for the measuremnt of 4-element DC
resistance with a controlled metallic voltage VDC-TG
(Tip-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.2 (MELT-CDCV-TG)";

      }

      leaf four-element-dc-resistance-test-voltage-rg {
        type dc-test-voltage;
        description
          "The DC test voltage for the measuremnt of 4-element DC
resistance with a controlled metallic voltage VDC-RG
(Ring-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.2 (MELT-CDCV-RG)";

      }

      leaf four-element-dc-resistance-test-current-tr {
        type test-current;
        description
          "The test current for the measuremnt of 4-element DC
resistance with a controlled metallic voltage IDC-TR
(Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.3 (MELT-CDCI-TR)";

      }

      leaf four-element-dc-resistance-test-current-rt {
        type test-current;
        description
          "The test current for the measuremnt of 4-element DC
resistance with a controlled metallic voltage IDC-RT
(Ring-to-Tip)";
        reference
          "ITU-T G.996.2 clause E.2.3.3 (MELT-CDCI-RT)";

      }

      leaf four-element-dc-resistance-test-current-tg {
        type test-current;
        description
          "The test current for the measuremnt of 4-element DC
resistance with a controlled metallic voltage IDC-TG
(Tip-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.3 (MELT-CDCI-TG)";

      }

      leaf four-element-dc-resistance-test-current-rg {
        type test-current;
        description
          "The test current for the measuremnt of 4-element DC
resistance with a controlled metallic voltage IDC-RG
(Ring-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.3 (MELT-CDCI-RG)";

      }

      leaf loop-resistance-test-voltage-tr {
        type loop-resistance-test-voltage;
        description
          "The test voltage for the measurement of the loop resistance
with a high metallic voltage VDCH-TR (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.8 (MELT-HDCV-TR)";

      }

      leaf loop-resistance-test-voltage-rt {
        type loop-resistance-test-voltage;
        description
          "The test voltage for the measurement of the loop resistance
with a high metallic voltage VDCH-RT (Ring-to-Tip)";
        reference
          "ITU-T G.996.2 clause E.2.3.8 (MELT-HDCV-RT)";

      }

      leaf three-element-complex-admittance-real-tr {
        type complex-admittance;
        description
          "The real part of the 3-element complex admittance
with controlled metallic voltage (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.9 (MELT-CAG-TR)";

      }

      leaf three-element-complex-admittance-imaginary-tr {
        type complex-admittance;
        description
          "The imaginary part of the 3-element complex admittance
with controlled metallic voltage (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.9 (MELT-CAB-TR)";

      }

      leaf three-element-complex-admittance-real-tg {
        type complex-admittance;
        description
          "The real part of the 3-element complex admittance
with controlled metallic voltage (Tip-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.9 (MELT-CAG-TG)";

      }

      leaf three-element-complex-admittance-imaginary-tg {
        type complex-admittance;
        description
          "The imaginary part of the 3-element complex admittance
with controlled metallic voltage (Tip-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.9 (MELT-CAB-TG)";

      }

      leaf three-element-complex-admittance-real-rg {
        type complex-admittance;
        description
          "The real part of the 3-element complex admittance
with controlled metallic voltage (Ring-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.9 (MELT-CAG-RG)";

      }

      leaf three-element-complex-admittance-imaginary-rg {
        type complex-admittance;
        description
          "The imaginary part of the 3-element complex admittance
with controlled metallic voltage (Ring-to-Ground)";
        reference
          "ITU-T G.996.2 clause E.2.3.9 (MELT-CAB-RG)";

      }

      leaf loop-complex-admittance-real-hv-tr {
        type loop-complex-admittance;
        description
          "The real part of the loop complex admittance with high
metallic voltage (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.10 (MELT-HAG-TR)";

      }

      leaf loop-complex-admittance-imaginary-hv-tr {
        type loop-complex-admittance;
        description
          "The imaginary part of the loop complex admittance with high
metallic voltage (Tip-to-Ring)";
        reference
          "ITU-T G.996.2 clause E.2.3.10 (MELT-HAB-TR)";

      }

      leaf three-element-capacitance-measurement-voltage-tr {
        type measurement-voltage;
        description
          "The range of valid values for the AC voltage VACTR-CC
for the 3-element capacitance test with a controlled metallic
voltage is from 0 V rms to 150 V rms. The values shall be
represented in linear format with a granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.3.11 (MELT-ACV-CC-TR)";

      }

      leaf three-element-capacitance-measurement-voltage-tg {
        type measurement-voltage;
        description
          "The range of valid values for the AC voltage VACTG-CC
for the 3-element capacitance test with a controlled metallic
voltage is from 0 V rms to 150 V rms. The values shall be
represented in linear format with a granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.3.11 (MELT-ACV-CC-TG)";

      }

      leaf three-element-capacitance-measurement-voltage-rg {
        type measurement-voltage;
        description
          "The range of valid values for the AC voltage VACRG-CC
for the 3-element capacitance test with a controlled metallic
voltage is from 0 V rms to 150 V rms. The values shall be
represented in linear format with a granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.3.11 (MELT-ACV-CC-RG)";

      }

      leaf loop-capacitance-measurement-voltage-tr {
        type measurement-voltage;
        description
          "The range of valid values for the AC voltage VACTR-HC for the
loop capacitance test with a high metallic voltage is from 0
V rms to 150 V rms. The values shall be represented in linear
format with a granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.3.12 (MELT-ACV-HC-TR)";

      }

      leaf three-element-complex-admittance-measurement-voltage-tr {
        type measurement-voltage;
        description
          "The range of valid values for the AC voltage VACTR-CA for the
3-element complex admittance test with a controlled metallic
voltage is from 0 V rms to 150 V rms. The values shall be
represented in linear format with a granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.3.13 (MELT-ACV-CA-TR)";

      }

      leaf three-element-complex-admittance-measurement-voltage-tg {
        type measurement-voltage;
        description
          "The range of valid values for the AC voltage VACTG-CA for the
3-element complex admittance test with a controlled metallic
voltage is from 0 V rms to 150 V rms. The values shall be
represented in linear format with a granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.3.13 (MELT-ACV-CA-TG)";

      }

      leaf three-element-complex-admittance-measurement-voltage-rg {
        type measurement-voltage;
        description
          "The range of valid values for the AC voltage VACRG-CA for the
3-element complex admittance test with a controlled metallic
voltage is from 0 V rms to 150 V rms. The values shall be
represented in linear format with a granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.3.13 (MELT-ACV-CA-RG)";

      }

      leaf loop-complex-admittance-measurement-voltage-tr {
        type measurement-voltage;
        description
          "The range of valid values for the AC voltage VACTR-HA for the
loop complex admittance test with a high metallic voltage is
from 0 V rms to 150 V rms. The values shall be represented in
linear format with a granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.3.14 (MELT-ACV-HA-TR)";

      }

      leaf unreliability-indicator {
        if-feature melt-pmd-measurement-parameter-reliability;
        type bits {
          bit
            four-element-dc-resistance-tr {
            position 0;
            description
              "The 4-element DC resistance with controlled metallic
voltage, RTR (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-TR)";

          }
          bit
            four-element-dc-resistance-rt {
            position 1;
            description
              "The 4-element DC resistance with controlled metallic
voltage, RRT (Ring-to-Tip).";
            reference
              "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-RT)";

          }
          bit
            four-element-dc-resistance-tg {
            position 2;
            description
              "The 4-element DC resistance with controlled metallic
voltage, RTG (Tip-to-Ground.)";
            reference
              "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-TG)";

          }
          bit
            four-element-dc-resistance-rg {
            position 3;
            description
              "The 4-element DC resistance with controlled metallic
voltage, RRG (Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.1 (MELT-CDCR-RG)";

          }
          bit three-element-capacitance-tr {
            position 4;
            description
              "The 3-element capacitance with controlled metallic
voltage, CTR (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.4 (MELT-CC-TR)";

          }
          bit three-element-capacitance-tg {
            position 5;
            description
              "The 3-element capacitance with controlled metallic
voltage, CTG (Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.4 (MELT-CC-TG)";

          }
          bit three-element-capacitance-rg {
            position 6;
            description
              "The 3-element capacitance with controlled metallic
voltage, CRG (Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.4 (MELT-CC-RG)";

          }
          bit foreign-dc-voltage-tr {
            position 7;
            description
              "The foreign DC voltage, VTR-DC (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.5 (MELT-FVDC-TR)";

          }
          bit foreign-dc-voltage-tg {
            position 8;
            description
              "The foreign DC voltage, VTG-DC (Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.5 (MELT-FVDC-TG)";

          }
          bit foreign-dc-voltage-rg {
            position 9;
            description
              "The foreign DC voltage, VRG-DC (Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.5 (MELT-FVDC-RG)";

          }
          bit foreign-ac-voltage-tr {
            position 10;
            description
              "The foreign AC voltage, VTR-AC (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.5 (MELT-FVAC-TR)";

          }
          bit foreign-ac-voltage-tg {
            position 11;
            description
              "The foreign AC voltage, VTG-AC (Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.5 (MELT-FVAC-TG)";

          }
          bit foreign-ac-voltage-rg {
            position 12;
            description
              "The foreign AC voltage, VRG-AC (Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.5 (MELT-FVAC-RG)";

          }
          bit
            foreign-ac-voltage-frequency-tr {
            position 13;
            description
              "The foreign AC voltage frequency for VTR-AC
(Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.5 (MELT-FVACF-TR)";

          }
          bit
            foreign-ac-voltage-frequency-tg {
            position 14;
            description
              "The foreign AC voltage frequency for VTG-AC
(Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.5 (MELT-FVACF-TG)";

          }
          bit
            foreign-ac-voltage-frequency-rg {
            position 15;
            description
              "The foreign AC voltage frequency for VRG-AC
(Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.5 (MELT-FVACF-RG)";

          }
          bit loop-capacitance-hv-tr {
            position 16;
            description
              "The loop capacitance CTR-HV (Tip-to-Ring) shall be
represented in linear format. The range of valid values
is from 0 to 5 uF with a granularity of 0.1 nF. The
CTR-HV value of the loop capacitance with high metallic
voltage test is the total capacitance measured. The CTR
value obtained from the 3-element capacitance with
controlled metallic voltage test is not subtracted from
the results.";
            reference
              "ITU-T G.996.2 clause E.2.3.6 (MELT-HV-TR)";

          }
          bit loop-resistance-hv-tr {
            position 17;
            description
              "The loop resistance with high metallic voltage, RTR-HV
(Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.7 (MELT-HDCR-TR.";

          }
          bit loop-resistance-hv-rt {
            position 18;
            description
              "The loop resistance with high metallic voltage, RRT-HV
(Ring-to-Tip).";
            reference
              "ITU-T G.996.2 clause E.2.3.7 (MELT-HDCR-RT)";

          }
          bit
            four-element-dc-resistance-test-voltage-tr {
            position 19;
            description
              "The DC test voltage for the measuremnt of 4-element DC
resistance with a controlled metallic voltage VDC-TR
(Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.2 (MELT-CDCV-TR)";

          }
          bit
            four-element-dc-resistance-test-voltage-rt {
            position 20;
            description
              "The DC test voltage for the measuremnt of 4-element DC
resistance with a controlled metallic voltage VDC-RT
(Ring-to-Tip).";
            reference
              "ITU-T G.996.2 clause E.2.3.2 (MELT-CDCV-RT)";

          }
          bit
            four-element-dc-resistance-test-voltage-tg {
            position 21;
            description
              "The DC test voltage for the measuremnt of 4-element DC
resistance with a controlled metallic voltage VDC-TG
(Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.2 (MELT-CDCV-TG)";

          }
          bit
            four-element-dc-resistance-test-voltage-rg {
            position 22;
            description
              "The DC test voltage for the measuremnt of 4-element DC
resistance with a controlled metallic voltage VDC-RG
(Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.2 (MELT-CDCV-RG)";

          }
          bit
            four-element-dc-resistance-test-current-tr {
            position 23;
            description
              "The test current for the measuremnt of 4-element DC
resistance with a controlled metallic voltage IDC-TR
(Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.3 (MELT-CDCI-TR)";

          }
          bit
            four-element-dc-resistance-test-current-rt {
            position 24;
            description
              "The test current for the measuremnt of 4-element DC
resistance with a controlled metallic voltage IDC-RT
(Ring-to-Tip).";
            reference
              "ITU-T G.996.2 clause E.2.3.3 (MELT-CDCI-RT)";

          }
          bit
            four-element-dc-resistance-test-current-tg {
            position 25;
            description
              "The test current for the measuremnt of 4-element DC
resistance with a controlled metallic voltage IDC-TG
(Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.3 (MELT-CDCI-TG)";

          }
          bit
            four-element-dc-resistance-test-current-rg {
            position 26;
            description
              "The test current for the measuremnt of 4-element DC
resistance with a controlled metallic voltage IDC-RG
(Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.3 (MELT-CDCI-RG)";

          }
          bit
            loop-resistance-test-voltage-tr {
            position 27;
            description
              "The test voltage for the measurement of the loop
resistance with a high metallic voltage VDCH-TR
(Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.8 (MELT-HDCV-TR)";

          }
          bit
            loop-resistance-test-voltage-rt {
            position 28;
            description
              "The test voltage for the measurement of the loop
resistance with a high metallic voltage VDCH-RT
(Ring-to-Tip).";
            reference
              "ITU-T G.996.2 clause E.2.3.8 (MELT-HDCV-RT)";

          }
          bit
            three-element-complex-admittance-real-tr {
            position 29;
            description
              "The real part of the 3-element complex admittance
with controlled metallic voltage (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.9 (MELT-CAG-TR)";

          }
          bit
            three-element-complex-admittance-imaginary-tr {
            position 30;
            description
              "The imaginary part of the 3-element complex admittance
with controlled metallic voltage (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.9 (MELT-CAB-TR)";

          }
          bit
            three-element-complex-admittance-real-tg {
            position 31;
            description
              "The real part of the 3-element complex admittance
with controlled metallic voltage (Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.9 (MELT-CAG-TG)";

          }
          bit
            three-element-complex-admittance-imaginary-tg {
            position 32;
            description
              "The imaginary part of the 3-element complex admittance
with controlled metallic voltage (Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.9 (MELT-CAB-TG)";

          }
          bit
            three-element-complex-admittance-real-rg {
            position 33;
            description
              "The real part of the 3-element complex admittance
with controlled metallic voltage (Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.9 (MELT-CAG-RG)";

          }
          bit
            three-element-complex-admittance-imaginary-rg {
            position 34;
            description
              "The imaginary part of the 3-element complex admittance
with controlled metallic voltage (Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.9 (MELT-CAB-RG)";

          }
          bit
            loop-complex-admittance-real-hv-tr {
            position 35;
            description
              "The real part of the loop complex admittance with high
metallic voltage (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.10 (MELT-HAG-TR)";

          }
          bit
            loop-complex-admittance-imaginary-hv-tr {
            position 36;
            description
              "The imaginary part of the loop complex admittance with
high metallic voltage (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.10 (MELT-HAB-TR)";

          }
          bit
            three-element-capacitance-measurement-voltage-tr {
            position 37;
            description
              "The AC voltage, VACTR-CC, for the 3-element capacitance
test with a controlled metallic voltage (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.11 (MELT-ACV-CC-TR)";

          }
          bit
            three-element-capacitance-measurement-voltage-tg {
            position 38;
            description
              "The AC voltage, VACTG-CC, for the 3-element capacitance
test with a controlled metallic voltage
(Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.11 (MELT-ACV-CC-TG)";

          }
          bit
            three-element-capacitance-measurement-voltage-rg {
            position 39;
            description
              "The AC voltage, VACRG-CC, for the 3-element capacitance
test with a controlled metallic voltage
(Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.11 (MELT-ACV-CC-RG)";

          }
          bit
            loop-capacitance-measurement-voltage-tr {
            position 40;
            description
              "The AC voltage, VACTR-HC, for the loop capacitance test
with a high metallic voltage (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.12 (MELT-ACV-HC-TR)";

          }
          bit
            three-element-complex-admittance-measurement-voltage-tr {
            position 41;
            description
              "The AC voltage, VACTR-CA, for the 3-element complex
admittance test with a controlled metallic voltage
(Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.13 (MELT-ACV-CA-TR)";

          }
          bit
            three-element-complex-admittance-measurement-voltage-tg {
            position 42;
            description
              "The AC voltage, VACTG-CA, for the 3-element complex
admittance test with a controlled metallic voltage
(Tip-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.13 (MELT-ACV-CA-TG)";

          }
          bit
            three-element-complex-admittance-measurement-voltage-rg {
            position 43;
            description
              "The AC voltage, VACRG-CA, for the 3-element complex
admittance test with a controlled metallic voltage
(Ring-to-Ground).";
            reference
              "ITU-T G.996.2 clause E.2.3.13 (MELT-ACV-CA-RG)";

          }
          bit
            loop-complex-admittance-measurement-voltage-tr {
            position 44;
            description
              "The AC voltage, VACTR-HA, for the loop complex admittance
test with a high metallic voltage (Tip-to-Ring).";
            reference
              "ITU-T G.996.2 clause E.2.3.14 (MELT-ACV-HA-TR)";

          }
        }
        description
          "The unreliability indicator provides the set of parameters
whose data can be considered to be unreliable.

Possible reasons that the data is unreliable:
  - The measurement may not have been able to run, possibly
    due to external conditions.
  - The result is not reliable as the accuracy may be
    degraded due to external conditions.";
        reference
          "ITU-T G.996.2 clause E.2.2.15 (Reliability indicator)";

      }
    }  // grouping pmd-measurement-parameters

    grouping pmd-reporting-parameters {
      description
        "Defines the Metallic Line Test Physical Medium Dependent
(MELT-PMD) reporting parameters.";
      leaf measurement-frequency {
        type uint16 {
          range "10..1000";
        }
        units "1 Hz";
        description
          "This parameter is the measurement frequency for a 3-element
capacitance measurement, if performed with a sinewave
signal, or a for 3-element complex admittance measurement.
The range of valid values is from 10 to 1000 Hz with a
granularity of 1 Hz.";
        reference
          "ITU-T G.996.2 clause E.2.2.1 (MELT-MFREQ)";

      }

      leaf foreign-voltage-input-impedance {
        type uint32 {
          range "0..10000000";
        }
        units "1 ohm";
        description
          "This parameter reports the nominal input impedance of the
measuring instrument during foreign voltage tests. The range
of valid values is from 0 to 10 Mohm with a granularity of
1 ohm.";
        reference
          "ITU-T G.996.2 clause E.2.2.2 (MELT-IMP-V)";

      }

      leaf loop-complex-admittance-measurement-voltage {
        type measurement-voltage;
        description
          "This parameter is the peak amplitude of the differential
sinewave used by the measurement of the loop complex
admittance with a high voltage metallic test (see
clause E.1.1.7). The range of valid values is from 0 to
150 V and it shall be represented in linear format with a
granularity of 0.1 V.";
        reference
          "ITU-T G.996.2 clause E.2.2.3 (MELT-HCA-V)";

      }

      leaf unreliability-indicator {
        if-feature melt-pmd-reporting-parameter-reliability;
        type bits {
          bit measurement-frequency {
            position 0;
            description
              "This parameter is the measurement frequency for a
3-element capacitance measurement, if performed with a
sinewave signal, or a for 3-element complex admittance
measurement. The range of valid values is from 10 to 1000
Hz with a granularity of 1 Hz.";
            reference
              "ITU-T G.996.2 clause E.2.2.1 (MELT-MFREQ)";

          }
          bit
            foreign-voltage-input-impedance {
            position 1;
            description
              "This parameter reports the nominal input impedance of the
measuring instrument during foreign voltage tests. The
range of valid values is from 0 to 10 Mohm with a
granularity of 1 ohm.";
            reference
              "ITU-T G.996.2 clause E.2.2.2 (MELT-IMP-V)";

          }
          bit
            loop-complex-admittance-measurement-voltage {
            position 2;
            description
              "This parameter is the peak amplitude of the differential
sinewave used by the measurement of the loop complex
admittance with a high voltage metallic test (see
clause E.1.1.7). The range of valid values is from 0 to
150 V and it shall be represented in linear format with a
granularity of 0.1 V.";
            reference
              "ITU-T G.996.2 clause E.2.2.3 (MELT-HCA-V)";

          }
        }
        description
          "The unreliability indicator provides the set of parameters
whose data can be considered to be unreliable.

Possible reasons that the data is unreliable:
  - The measurement may not have been able to run, possibly
    due to external conditions.
  - The result is not reliable as the accuracy may be
    degraded due to external conditions.";
        reference
          "ITU-T G.996.2 clause E.2.2.4 (Reliability indicator)";

      }
    }  // grouping pmd-reporting-parameters

    grouping processing-derived-parameters {
      description
        "Defines the Metallic Line Test Processing (MELT-P) derived
parameters.";
      leaf open-wire-failure-type {
        type enumeration {
          enum "no-open" {
            value 0;
            description
              "No open wire failure detected";
          }
          enum "tip-ring-open" {
            value 1;
            description
              "Tip and ring wires open in equal distance";
          }
          enum "tip-open" {
            value 2;
            description "Tip wire open";
          }
          enum "ring-open" {
            value 3;
            description "Ring wire open";
          }
          enum "undefined" {
            value 4;
            description "Undefined";
          }
        }
        description
          "This sub-parameter is a five state indication of the type of
open wire failure defined as follows:

1) No open wire failure detected
2) Tip and ring wires open in equal distance
3) Tip wire open
4) Ring wire open
5) Undefined.

NOTE - An error-free loop will be classified as failure
state 2) in case that the remote end of the loop was left
open during the measurement, or the connected Customer
Premises Equipment (CPE) could not be detected (too low
parallel CPE system capacitance).";
        reference
          "ITU-T G.996.2 clause F.2.2.1.1 (MELT-O-WIRE-type)";

      }

      leaf open-wire-failure-distance {
        type uint16 {
          range "0..10000";
        }
        units "1 m";
        description
          "This parameter represents a best-effort estimate of the
distance of the detected open wire failure from the
measurement point, i.e., from the central office or of the
total loop length if no failure is detected. A priori
knowledge of the loop characteristics is required for
reliable estimation of the distance (see clause F.2.1.2).
The range of valid values is from 0 to 10000 m with a
granularity of 1 m.";
        reference
          "ITU-T G.996.2 clause F.2.2.1.2 (MELT-O-WIRE-DIST)";

      }

      leaf short-circuit-failure-type {
        type enumeration {
          enum "no-short" {
            value 0;
            description
              "No short circuit detected.";
          }
          enum "tip-ring-short-to-ground" {
            value 1;
            description
              "Tip and ring wires shorted to ground (GND).";
          }
          enum "tip-short-to-ground" {
            value 2;
            description
              "Tip wire shorted to ground (GND).";
          }
          enum "ring-short-to-ground" {
            value 3;
            description
              "Ring wire shorted to ground (GND).";
          }
          enum
            "tip-ring-short-to-each-other" {
            value 4;
            description
              "Tip and ring wires shorted to each other.";
          }
          enum "undefined" {
            value 5;
            description "Undefined.";
          }
        }
        description
          "This parameter is a six-state indication of the type of
short circuit failure defined as follows:

1) No short circuit detected
2) Tip and ring wires shorted to GND
3) Tip wire shorted to GND
4) Ring wire shorted to GND
5) Tip and ring wires shorted to each other
6) Undefined.";
        reference
          "ITU-T G.996.2 clause F.2.2.2.1 (MELT-S-CCT-type)";

      }

      leaf leakage-identification {
        type enumeration {
          enum "no-leakage" {
            value 0;
            description
              "No leakage detected.";
          }
          enum "tip-ring-leaking" {
            value 1;
            description
              "Tip and ring wire leaking to ground (GND).";
          }
          enum "tip-leaking" {
            value 2;
            description
              "Tip wire leaking to ground (GND).";
          }
          enum "ring-leaking" {
            value 3;
            description
              "Ring wire leaking to ground (GND).";
          }
        }
        description
          "This parameter indicates a leakage to ground (GND) failure,
classified into the following states:

1) No leakage detected
2) Tip and ring wire leaking to GND
3) Tip wire leaking to GND
4) Ring wire leaking to GND.";
        reference
          "ITU-T G.996.2 clause F.2.2.3 (MELT-LEAK-ID)";

      }

      leaf resistive-fault-identification {
        type enumeration {
          enum "no-fault" {
            value 0;
            description
              "No resistive fault detected.";
          }
          enum "tip-ring-fault" {
            value 1;
            description
              "Resistive fault tip and ring to ground (GND).";
          }
          enum "tip-fault" {
            value 2;
            description
              "Resistive fault tip to ground (GND).";
          }
          enum "ring-fault" {
            value 3;
            description
              "Resistive fault ring to ground (GND).";
          }
        }
        description
          "This parameter indicates a resistive fault to ground (GND)
failure, classified into the following states:

1) No resistive fault detected
2) Resistive fault tip and ring to GND
3) Resistive fault tip to GND
4) Resistive fault ring to GND.";
        reference
          "ITU-T G.996.2 clause F.2.2.4 (MELT-RFAULT-ID)";

      }

      leaf foreign-voltage-type-classification {
        type enumeration {
          enum "no-foreign-voltage-detected" {
            value 0;
            description
              "No foreign voltage detected.";
          }
          enum "16-hz-ac-voltage" {
            value 1;
            description
              "16 2/3 Hz AC voltage on both tip and ring wires.";
          }
          enum "25-hz-ac-voltage" {
            value 2;
            description
              "25 Hz AC voltage on both tip and ring wires.";
          }
          enum "50-hz-ac-voltage" {
            value 3;
            description
              "50 Hz AC voltage on both tip and ring wires.";
          }
          enum "60-hz-ac-voltage" {
            value 4;
            description
              "60 Hz AC voltage on both tip and ring wires.";
          }
          enum "pots-equipment" {
            value 5;
            description
              "POTS equipment (-48 V DC) on both tip and ring wires.";
          }
          enum "isdn-equipment" {
            value 6;
            description
              "ISDN equipment (-96 V DC) on both tip and ring wires.";
          }
          enum
            "undefined-foreign-voltage-detected" {
            value 7;
            description
              "Undefined foreign voltage detected on both tip and
ring wires.";
          }
          enum "16-hz-ac-voltage-tip" {
            value 8;
            description
              "16 2/3 Hz AC voltage on the tip wire.";
          }
          enum "16-hz-ac-voltage-ring" {
            value 9;
            description
              "16 2/3 Hz AC voltage on the ring wire.";
          }
          enum "25-hz-ac-voltage-tip" {
            value 10;
            description
              "25 Hz AC voltage on the the tip wire.";
          }
          enum "25-hz-ac-voltage-ring" {
            value 11;
            description
              "25 Hz AC voltage on the the ring wire.";
          }
          enum "50-hz-ac-voltage-tip" {
            value 12;
            description
              "50 Hz AC voltage on the tip wire.";
          }
          enum "50-hz-ac-voltage-ring" {
            value 13;
            description
              "50 Hz AC voltage on the ring wire.";
          }
          enum "60-hz-ac-voltage-tip" {
            value 14;
            description
              "60 Hz AC voltage on the tip wire.";
          }
          enum "60-hz-ac-voltage-ring" {
            value 15;
            description
              "60 Hz AC voltage on the ring wire.";
          }
          enum "pots-equipment-tip" {
            value 16;
            description
              "POTS equipment (-48 V DC) on the tip wire.";
          }
          enum "pots-equipment-ring" {
            value 17;
            description
              "POTS equipment (-48 V DC) on the ring wire.";
          }
          enum "isdn-equipment-tip" {
            value 18;
            description
              "ISDN equipment (-96 V DC) on the tip wire.";
          }
          enum "isdn-equipment-ring" {
            value 19;
            description
              "ISDN equipment (-96 V DC) on the ring wire.";
          }
          enum
            "undefined-foreign-voltage-detected-tip" {
            value 20;
            description
              "Undefined foreign voltage detected on the tip wire.";
          }
          enum
            "undefined-foreign-voltage-detected-ring" {
            value 21;
            description
              "Undefined foreign voltage detected on the ring wire.";
          }
        }
        description
          "The foreign voltage impairment in the loop under test is
classified into the following states:

1) No foreign voltage detected
2) 16 2/3 Hz AC voltage
3) 25 Hz AC voltage
4) 50 Hz AC voltage
5) 60 Hz AC voltage
6) POTS equipment (-48 V DC)
7) ISDN equipment (-96 V DC)
8) Undefined foreign voltage detected.

This classification shall be done separately for both, the
tip and the ring wire. ";
        reference
          "ITU-T G.996.2 clause F.2.2.5.1 (MELT-FV-TYPE)";

      }

      leaf foreign-voltage-level-classification {
        type enumeration {
          enum "hazardous-potential" {
            value 0;
            description
              "Hazardous potential (e.g., power contact).";
          }
          enum "foreign-electromotive-force" {
            value 1;
            description
              "Foreign electromotive force.";
          }
          enum "other" {
            value 2;
            description "Other.";
          }
        }
        description
          "This parameter provides a general classification of the
foreign voltage into the following classes:

1) hazardous potential (e.g., power contact)
2) foreign electromotive force
3) other";
        reference
          "ITU-T G.996.2 clause F.2.2.5.2 (MELT-FV-LEVEL)";

      }

      leaf far-end-signature-topology-type-identification {
        type enumeration {
          enum "no-signature-detected" {
            value 0;
            description
              "No signature detected.";
          }
          enum "unknown-signature" {
            value 1;
            description "Unknown signature.";
          }
          enum "signature-type-dr" {
            value 2;
            description
              "Signature type DR detected.";
          }
          enum "signature-type-zrc" {
            value 3;
            description
              "Signature type ZRC detected.";
          }
          enum "signature-type-dr-inverse" {
            value 4;
            description
              "Signature type DR inverse detected.";
          }
          enum "signature-type-dr-plus-zrc" {
            value 5;
            description
              "Signature types DR and XRC detected.";
          }
          enum
            "signature-type-dr-inverse-plus-zrc" {
            value 6;
            description
              "Signature types DR inverse and XRC detected.";
          }
        }
        description
          "This parameter specifies the topology types of the detected
far-end signature.

Valid response values are:

- no signature detected
- unknown signature
- signature type DR detected
- signature type ZRC detected";
        reference
          "ITU-T G.996.2 clause F.2.2.6.1 (MELT-FES-ID)";

      }

      leaf cpe-identification-capacitive {
        type enumeration {
          enum "no-cpe-detected" {
            value 0;
            description
              "No CPE has been detected.";
          }
          enum "cpe-detected" {
            value 1;
            description
              "A CPE has been detected.";
          }
        }
        description
          "CPE detected shall be reported if the measured capacitance
value CTR-Term is >= MELT-SYSC-CPE. CTR-Term shall represent
the termination capacitance only. Therefore, the line
capacitance shall be subtracted from the measured CTR value.
For this equation to hold, the MELT-SYSC-CPE value should be
derived from the nominal CPE capacitance by accounting for
all tolerances and be set to the minimum possible measurement
result.";
        reference
          "ITU-T G.996.2 clause F.2.2.7 (MELT-CPE-ID)";

      }

      leaf unreliability-indicator {
        if-feature melt-processing-derived-parameter-reliability;
        type bits {
          bit open-wire-failure-type {
            position 0;
            description
              "This sub-parameter is a five state indication of the type
of open wire failure defined as follows:

1) No open wire failure detected
2) Tip and ring wires open in equal distance
3) Tip wire open
4) Ring wire open
5) Undefined.

NOTE - An error-free loop will be classified as failure
state 2) in case that the remote end of the loop was left
open during the measurement, or the connected CPE
equipment could not be detected (too low parallel CPE
system capacitance).";
            reference
              "ITU-T G.996.2 clause F.2.2.1.1 (MELT-O-WIRE-type)";

          }
          bit open-wire-failure-distance {
            position 1;
            description
              "This parameter represents a best-effort estimate of the
distance of the detected open wire failure from the
measurement point, i.e., from the central office or of
the total loop length if no failure is detected. A priori
knowledge of the loop characteristics is required for
reliable estimation of the distance (see clause F.2.1.2).
The range of valid values is from 0 to 10000 m with a
granularity of 1 m.";
            reference
              "ITU-T G.996.2 clause F.2.2.1.2 (MELT-O-WIRE-DIST)";

          }
          bit short-circuit-failure-type {
            position 2;
            description
              "This parameter is a six-state indication of the type of
short circuit failure defined as follows:

1) No short circuit detected
2) Tip and ring wires shorted to GND
3) Tip wire shorted to GND
4) Ring wire shorted to GND
5) Tip and ring wires shorted to each other
6) Undefined";
            reference
              "ITU-T G.996.2 clause F.2.2.2.1 (MELT-S-CCT-type)";

          }
          bit leakage-identification {
            position 3;
            description
              "This parameter indicates a leakage to GND failure,
classified into the following states:

1) No leakage detected
2) Tip and ring wire leaking to GND
3) Tip wire leaking to GND
4) Ring wire leaking to GND.";
            reference
              "ITU-T G.996.2 clause F.2.2.3 (MELT-LEAK-ID)";

          }
          bit
            resistive-fault-identification {
            position 4;
            description
              "This parameter indicates a resistive fault to GND
failure, classified into the following states:

1) No resistive fault detected
2) Resistive fault tip and ring to GND
3) Resistive fault tip to GND
4) Resistive fault ring to GND.";
            reference
              "ITU-T G.996.2 clause F.2.2.4 (MELT-RFAULT-ID)";

          }
          bit
            foreign-voltage-type-classification {
            position 5;
            description
              "The foreign voltage impairment in the loop under test is
classified into the following states:

1) No foreign voltage detected
2) 16 2/3 Hz AC voltage
3) 25 Hz AC voltage
4) 50 Hz AC voltage
5) 60 Hz AC voltage
6) POTS equipment (-48 V DC)
7) ISDN equipment (-96 V DC)
8) Undefined foreign voltage detected.

This classification shall be done separately for both,
the tip and the ring wire. ";
            reference
              "ITU-T G.996.2 clause F.2.2.5.1 (MELT-FV-TYPE)";

          }
          bit
            foreign-voltage-level-classification {
            position 6;
            description
              "This parameter provides a general classification of the
foreign voltage into the following classes:

1) hazardous potential (e.g., power contact)
2) foreign electromotive force
3) other";
            reference
              "ITU-T G.996.2 clause F.2.2.5.2 (MELT-FV-LEVEL)";

          }
          bit
            far-end-signature-topology-type-identification {
            position 7;
            description
              "This parameter specifies the topology types of the
detected far-end signature.

Valid response values are:

- no signature detected
- unknown signature
- signature type DR detected
- signature type ZRC detected";
            reference
              "ITU-T G.996.2 clause F.2.2.6.1 (MELT-FES-ID)";

          }
          bit
            cpe-identification-capacitive {
            position 8;
            description
              "CPE detected shall be reported if the measured
capacitance value CTR-Term is >= MELT-SYSC-CPE. CTR-Term
shall represent the termination capacitance only.
Therefore, the line capacitance shall be subtracted from
the measured CTR value. For this equation to hold, the
MELT-SYSC-CPE value should be derived from the nominal
CPE capacitance by accounting for all tolerances and be
set to the minimum possible measurement result.";
            reference
              "ITU-T G.996.2 clause F.2.2.7 (MELT-CPE-ID)";

          }
        }
        description
          "The unreliability indicator provides the set of parameters
whose data can be considered to be unreliable.

Possible reasons that the data is unreliable:
  - The measurement may not have been able to run, possibly
    due to external conditions.
  - The result is not reliable as the accuracy may be
    degraded due to external conditions.";
        reference
          "ITU-T G.996.2 clause F.2.2.8 (Reliability indicator)";

      }
    }  // grouping processing-derived-parameters

    // objects
    container melt {
      description
        "Metallic Line Test (MELT) configuration.";
      container profiles {
        description
          "Configuration profiles.";
      }  // container profiles
    }  // container melt

    augment /if:interfaces/if:interface {
      when "if:type = 'ianaift:fastdsl'" {
        description
          "Only applicable when the interface type is 'fastdsl'.";
      }
      description
        "Data nodes for the configuration of Metallic Line Test
(MELT).";
      container melt {
        presence
          "If present, indicates that the interface is capable of
performing MELT functionality as defined in ITU-T G.996.2.";
        description
          "Configuration data for MELT.";
      }  // container melt
    }

    augment /if:interfaces-state/if:interface {
      when "if:type = 'ianaift:fastdsl'" {
        description
          "Only applicable when the interface type is 'fastdsl'.";
      }
      description
        "Data nodes for the operational state data of
Metallic Line Test (MELT).";
      container melt {
        presence
          "If present, indicates that the interface is capable of
performing Metallic Line Test (MELT) functionality as defined
in ITU-T G.996.2.";
        description
          "Operational state data for Metallic Line Test (MELT).";
      }  // container melt
    }

    augment /bbf-melt:melt/bbf-melt:profiles {
      description
        "Data nodes for Physical Medium Dependent (PMD) configuration
profiles.";
      list pmd-profile {
        key "name";
        description
          "A list of Physical Medium Dependent (PMD) profiles.";
        leaf name {
          type bbf-yang:string-ascii64;
          description
            "A name that uniquely identifies the profile.";
        }

        uses pmd-profile;
      }  // list pmd-profile
    }

    augment /bbf-melt:melt/bbf-melt:profiles {
      description
        "Data nodes for processing profiles.";
      list processing-profile {
        key "name";
        description
          "A list of processing profiles.";
        leaf name {
          type bbf-yang:string-ascii64;
          description
            "A name that uniquely identifies the profile.";
        }

        uses processing-profile;
      }  // list processing-profile
    }

    augment /if:interfaces/if:interface/bbf-melt:melt {
      description
        "Data nodes to support the assignment of Metallic Line Test
(MELT) configuration.";
      leaf pmd-profile {
        type pmd-profile-ref;
        status deprecated;
        description
          "References a Metallic Line Test Physical Medium Dependent
(MELT-PMD) profile. This method of configuration has been
deprecated. The 'profile-config' method should instead be
used.";
      }

      leaf processing-profile {
        if-feature melt-p;
        type leafref {
          path "/bbf-melt:melt/bbf-melt:profiles/bbf-melt:processing-profile/bbf-melt:name";
        }
        status deprecated;
        description
          "References a Metallic Test Processing (MELT-P) profile. This
method of configuration has been deprecated. The
'profile-config' method should instead be used.";
      }

      container melt-pmd-control {
        status deprecated;
        description
          "Data nodes to support the Metallic Line Test Physical Medium
Dependent (MELT-PMD) control object";
        uses melt-pmd-control {
          status deprecated;
        }
      }  // container melt-pmd-control

      choice profile-config {
        default "no-profiles-attached";
        description
          "Provides methods attachment of profiles.";
        leaf no-profiles-attached {
          type empty;
          description
            "If present, indicates that no profiles are attached
to this line";
        }
        container direct-attachment-mode {
          description
            "Configuration associated with assigning Metallic Line
Test (MELT) profiles.";
          leaf pmd-profile {
            type pmd-profile-ref;
            mandatory true;
            description
              "References a Metallic Line Test Physical Medium
Dependent (MELT-PMD) profile.";
          }

          leaf processing-profile {
            if-feature melt-p;
            type leafref {
              path "/bbf-melt:melt/bbf-melt:profiles/bbf-melt:processing-profile/bbf-melt:name";
            }
            mandatory true;
            description
              "References a Metallic Test Processing (MELT-P)
profile.";
          }
        }  // container direct-attachment-mode
      }  // choice profile-config
    }

    augment /if:interfaces/if:interface/bbf-melt:melt/bbf-melt:profile-config/bbf-melt:direct-attachment-mode/bbf-melt:direct-attachment-mode {
      description
        "Data nodes for the configuration of Metallic Line Test Physical
Medium Dependent (MELT-PMD) control.";
      container pmd-control {
        description
          "Data nodes to support the Metallic Line Test Physical Medium
Dependent (MELT-PMD) control object.";
        uses pmd-control;
      }  // container pmd-control
    }

    augment /if:interfaces-state/if:interface/bbf-melt:melt {
      description
        "Data nodes for the configuration of Metallic Line Test Physical
Medium Dependent (MELT-PMD) status.";
      container pmd-status {
        description
          "Status associated with the Metallic Line Test Physical
Medium Dependent (MELT-PMD) control object.";
        uses pmd-status;
      }  // container pmd-status

      notification melt-pmd-completed {
        description
          "Indicates that a Metallic Line Test Physical Medium Dependent
(MELT-PMD) function has failed, succeeded or has been
aborted.";
        leaf function {
          type pmd-function;
          mandatory true;
          description
            "The function that was performed or attempted to perform.";
        }

        leaf result {
          type pmd-result;
          mandatory true;
          description
            "The result of the attempted execution of the Metallic Line
Test Physical Medium Dependent (MELT-PMD) function.";
        }
      }  // notification melt-pmd-completed
    }

    augment /if:interfaces-state/if:interface/bbf-melt:melt {
      description
        "Data nodes to support the reporting of Metallic Line Test
(MELT) result parameters.";
      container pmd-reporting-parameters {
        description
          "Metallic Line Test Physical Medium Dependent (MELT-PMD)
reporting parameters.";
        uses pmd-reporting-parameters;
      }  // container pmd-reporting-parameters

      container pmd-measurement-parameters {
        description
          "Metallic Line Test Physical Medium Dependent (MELT-PMD)
measurement parameters.";
        uses pmd-measurement-parameters;
      }  // container pmd-measurement-parameters

      container processing-derived-parameters {
        if-feature melt-p;
        description
          "Metallic Line Test Processing (MELT-P) derived parameters.";
        uses processing-derived-parameters;
      }  // container processing-derived-parameters
    }
  }  // module bbf-melt

Summary

  
bbf-melt-pmd-measurement-parameter-body  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-pmd-measurement-parameter-body
Version 2019-06-11
File bbf-melt-pmd-measurement-parameter-body.yang
  
  
Cooked /cookedmodules/bbf-melt-pmd-measurement-parameter-body/2019-06-11
YANG /src/bbf-melt-pmd-measurement-parameter-body@2019-06-11.yang
XSD /xsd/bbf-melt-pmd-measurement-parameter-body@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for Metallic Line Test Physical Medium Dependent (MELT-PMD) measurement...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-processing-profile-body  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-processing-profile-body
Version 2019-06-11
File bbf-melt-processing-profile-body.yang
  
  
Cooked /cookedmodules/bbf-melt-processing-profile-body/2019-06-11
YANG /src/bbf-melt-processing-profile-body@2019-06-11.yang
XSD /xsd/bbf-melt-processing-profile-body@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for managing processing profiles. Copyright (c) 2016-2019 Broadband Fo...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-pmd-profiles  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-pmd-profiles
Version 2019-06-11
File bbf-melt-pmd-profiles.yang
  
  
Cooked /cookedmodules/bbf-melt-pmd-profiles/2019-06-11
YANG /src/bbf-melt-pmd-profiles@2019-06-11.yang
XSD /xsd/bbf-melt-pmd-profiles@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for managing Metallic Line Test Physical Medium Dependent (MELT-PMD) pr...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-processing-profiles  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-processing-profiles
Version 2019-06-11
File bbf-melt-processing-profiles.yang
  
  
Cooked /cookedmodules/bbf-melt-processing-profiles/2019-06-11
YANG /src/bbf-melt-processing-profiles@2019-06-11.yang
XSD /xsd/bbf-melt-processing-profiles@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for managing Metallic Test Processing (MELT-P) profiles. Copyright (c)...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Module bbf-melt
Version 2019-06-11
File bbf-melt.yang
  
Prefix bbf-melt
Namespace urn:bbf:yang:bbf-melt
  
Cooked /cookedmodules/bbf-melt/2019-06-11
YANG /src/bbf-melt@2019-06-11.yang
XSD /xsd/bbf-melt@2019-06-11.xsd
  
Abstract This module contains a collection of YANG definitions for supporting Metallic Line Test (MELT) as defined in ITU G.996.2. Copyr...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-pmd  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-pmd
Version 2019-06-11
File bbf-melt-pmd.yang
  
  
Cooked /cookedmodules/bbf-melt-pmd/2019-06-11
YANG /src/bbf-melt-pmd@2019-06-11.yang
XSD /xsd/bbf-melt-pmd@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for managing the Physical Medium Dependent (PMD) object. Copyright (c)...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-pmd-reporting-parameter-body  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-pmd-reporting-parameter-body
Version 2019-06-11
File bbf-melt-pmd-reporting-parameter-body.yang
  
  
Cooked /cookedmodules/bbf-melt-pmd-reporting-parameter-body/2019-06-11
YANG /src/bbf-melt-pmd-reporting-parameter-body@2019-06-11.yang
XSD /xsd/bbf-melt-pmd-reporting-parameter-body@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for Metallic Line Test Physical Medium Dependent (MELT-PMD) reporting p...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-result-parameters  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-result-parameters
Version 2019-06-11
File bbf-melt-result-parameters.yang
  
  
Cooked /cookedmodules/bbf-melt-result-parameters/2019-06-11
YANG /src/bbf-melt-result-parameters@2019-06-11.yang
XSD /xsd/bbf-melt-result-parameters@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for managing Metallic Line Test (MELT) result parameters. Copyright (c...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-base  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-base
Version 2019-06-11
File bbf-melt-base.yang
  
  
Cooked /cookedmodules/bbf-melt-base/2019-06-11
YANG /src/bbf-melt-base@2019-06-11.yang
XSD /xsd/bbf-melt-base@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for managing top level Metallic Line Test (MELT) configuration and augm...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-pmd-control-body  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-pmd-control-body
Version 2019-06-11
File bbf-melt-pmd-control-body.yang
  
  
Cooked /cookedmodules/bbf-melt-pmd-control-body/2019-06-11
YANG /src/bbf-melt-pmd-control-body@2019-06-11.yang
XSD /xsd/bbf-melt-pmd-control-body@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for managing the Physical Medium Dependent (PMD) control object. Copyr...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-pmd-profile-body  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-pmd-profile-body
Version 2019-06-11
File bbf-melt-pmd-profile-body.yang
  
  
Cooked /cookedmodules/bbf-melt-pmd-profile-body/2019-06-11
YANG /src/bbf-melt-pmd-profile-body@2019-06-11.yang
XSD /xsd/bbf-melt-pmd-profile-body@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for managing Physical Medium Dependent (PMD) profiles. Copyright (c) 2...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-pmd-status-body  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-pmd-status-body
Version 2019-06-11
File bbf-melt-pmd-status-body.yang
  
  
Cooked /cookedmodules/bbf-melt-pmd-status-body/2019-06-11
YANG /src/bbf-melt-pmd-status-body@2019-06-11.yang
XSD /xsd/bbf-melt-pmd-status-body@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for managing the Physical Medium Dependent (PMD) object. Copyright (c)...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN
  
bbf-melt-processing-derived-parameter-body  
  
Organization Broadband Forum <https://www.broadband-forum.org> Common YANG Work Area
  
Submodule bbf-melt-processing-derived-parameter-body
Version 2019-06-11
File bbf-melt-processing-derived-parameter-body.yang
  
  
Cooked /cookedmodules/bbf-melt-processing-derived-parameter-body/2019-06-11
YANG /src/bbf-melt-processing-derived-parameter-body@2019-06-11.yang
XSD /xsd/bbf-melt-processing-derived-parameter-body@2019-06-11.xsd
  
Abstract This submodule contains a collection of YANG definitions for Metallic Line Test Processing (MELT-P) derived parameters. Copyrig...
  
Contact
Comments or questions about this Broadband Forum YANG module
should be directed to <mailto:help@broadband-forum.org>.

Editor:      Ken Kerpez, ASSIA, Inc.

Editor:      Joey Boyd, ADTRAN

PS Leader:   Ken Kerpez, ASSIA, Inc.

PS Leader:   Joey Boyd, ADTRAN

WA Director: Sven Ooghe, Nokia

WA Director: Joey Boyd, ADTRAN

Description

 
bbf-melt-pmd-measurement-parameter-body
This submodule contains a collection of YANG definitions for
Metallic Line Test Physical Medium Dependent (MELT-PMD)
measurement parameters.

Copyright (c) 2016-2019 Broadband Forum

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   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
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Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-processing-profile-body
This submodule contains a collection of YANG definitions for
managing processing profiles.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-pmd-profiles
This submodule contains a collection of YANG definitions for
managing Metallic Line Test Physical Medium Dependent (MELT-PMD)
profiles.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-processing-profiles
This submodule contains a collection of YANG definitions for
managing Metallic Test Processing (MELT-P) profiles.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt
This module contains a collection of YANG definitions for
supporting Metallic Line Test (MELT) as defined in ITU G.996.2.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-pmd
This submodule contains a collection of YANG definitions for
managing the Physical Medium Dependent (PMD) object.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-pmd-reporting-parameter-body
This submodule contains a collection of YANG definitions for
Metallic Line Test Physical Medium Dependent (MELT-PMD) reporting
parameters.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-result-parameters
This submodule contains a collection of YANG definitions for
managing Metallic Line Test (MELT) result parameters.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-base
This submodule contains a collection of YANG definitions for
managing top level Metallic Line Test (MELT) configuration and
augmenations to ietf-interfaces.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-pmd-control-body
This submodule contains a collection of YANG definitions for
managing the Physical Medium Dependent (PMD) control object.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-pmd-profile-body
This submodule contains a collection of YANG definitions for
managing Physical Medium Dependent (PMD) profiles.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-pmd-status-body
This submodule contains a collection of YANG definitions for
managing the Physical Medium Dependent (PMD) object.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.
 
bbf-melt-processing-derived-parameter-body
This submodule contains a collection of YANG definitions for
Metallic Line Test Processing (MELT-P) derived parameters.

Copyright (c) 2016-2019 Broadband Forum

Redistribution and use in source and binary forms, with or
without modification, are permitted provided that the following
conditions are met:

1. Redistributions of source code must retain the above copyright
   notice, this list of conditions and the following disclaimer.

2. Redistributions in binary form must reproduce the above
   copyright notice, this list of conditions and the following
   disclaimer in the documentation and/or other materials
   provided with the distribution.

3. Neither the name of the copyright holder nor the names of its
   contributors may be used to endorse or promote products
   derived from this software without specific prior written
   permission.

THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND
CONTRIBUTORS "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES,
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR
CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.

The above license is used as a license under copyright only.
Please reference the Forum IPR Policy for patent licensing terms
<https://www.broadband-forum.org/ipr-policy>.

Any moral rights which are necessary to exercise under the above
license grant are also deemed granted under this license.

This version of this YANG module is part of TR-355a2; see
the TR itself for full legal notices.

Typedefs

Typedef Base type Abstract
complex-admittance uint32 The range of valid values for the 3-element complex conductances and susceptances, GTR and BTR (Tip-to-Ring); GTG and BTG (Tip-to-Ground); and GRG and BRG (Ring-to-Ground) is from 0.1 uSiemens to 0.1 Siemens. The values shall be represented in linear form...
dc-test-voltage int16 The test voltages for the measurement of the 4-element DC resistance, VDCTR (Tip-to-Ring), VDCRT (Ring-to-Tip), VDCTG (Tip-to-Ground), and VDCRG (Ring-to-Ground), shall be represented in linear format. The range of valid values is from -150 V to +150 V wi...
foreign-ac-voltage uint16 The range of valid values for the foreign AC voltages VTR-AC (Tip-to-Ring), VTG-AC (Tip-to-Ground), and VRG-AC (Ring-To-Ground) is from 0 to 250Vrms. The foreign AC voltage shall be represented in linear format with a granularity of 100 mV.
foreign-ac-voltage-frequency uint16 The range of valid values for the foreign AC voltage FTR-AC (Tip-to-Ring), FTG-AC (Tip-to-Ground), and FRG-AC (Ring-To-Ground) is from 10 to 90 Hz with a granularity of 0.1 Hz.
foreign-dc-voltage int16 The range of valid values for the foreign DC voltages, VTR-DC (Tip-to-Ring), VTG-DC (Tip-to-Ground), and VRG-DC (Ring-to-Ground) is from -350 to 350V. The foreign DC voltage shall be represented in linear format with a granularity of 100 mV. The reported...
four-element-dc-resistance uint32 The 4-element DC resistances, RTR (Tip-to-Ring), RRT (Ring-to-Tip), RTG (Tip-to-Ground), and RRG (Ring-to-Ground), shall be represented in linear format. The range of valid values is from 0 to 10 Mohms with a granularity of 1 ohm.
loop-complex-admittance uint32 The range of valid values for the 3-element complex conductance and susceptance GTR,HV and BTR,HV (Tip-to-Ring) is from 0.1 uSiemens to 0.1 Siemens. The values shall be represented in linear format with a granularity of 0.1 uSiemens. The GTR,HV and BTR,HV...
loop-resistance uint32 The loop resistances RTF-HV (Tip-to-Ring) and RRT-HV (Ring-to-Tip) shall be represented in linear format. The range of valid values is from 0 to 10 Mohms with a granularity of 1 ohm. The RTR-HV and RRT-HV values of the loop resistance with high metallic v...
loop-resistance-test-voltage int16 The test voltages for the measurement of the loop resistance with a high metallic voltage, VDCHTR (Tip-to-Ring) and VDCHRT (Ring-to-Tip) shall be represented in linear format. The range of valid values is from -150 V to +150 V with a granularity of 0.1 V.
measurement-voltage uint16 The range of valid values for the AC voltages VACTR-CC (Tip-to-Ring), VACTG-CC (Tip-to-Ground), and VACRG-CC (Ring-to-Ground) for the 3-element capacitance test with a controlled metallic voltage is from 0 V rms to 150 V rms. The values shall be represent...
pmd-function enumeration The MELT PMD function.
pmd-profile-ref leafref Used to reference a Physical Medium Dependent (PMD) profile
pmd-result enumeration The overall results of the Physical Medium Dependent (PMD) measurement.
test-current int32 The test currents for the measurement of the 4-element DC resistance, IDCTR (Tip-to-Ring), IDCRT (Ring-to-Tip), IDCTG (Tip-to-Ground), and IDCRG (Ring-to-Ground), shall be represented in linear format. The range of valid values is from -1 A to +1 A with a...
three-element-capacitance int32 The 3-element capacitances, CTR (Tip-to-Ring), CTG (Tip-to-Ground), and CRG (Ring-to-Ground), shall be represented in linear format. The range of valid values is from -2 to 5 uF with a granularity of 0.1 nF.

Groupings

Grouping Objects Abstract
melt-pmd-control pmd-functions Defines the parameters contained in the Physical Medium Dependent (PMD) control object.
pmd-control pmd-control request-pmd-function-c Physical Medium Dependent (PMD) control functions.
pmd-measurement-parameters four-element-dc-resistance-tr four-element-dc-resistance-rt four-element-dc-resistance-tg four-element-dc-resistance-rg three-element-capacitance-tr three-element-capacitance-tg three-element-capacitance-rg foreign-dc-voltage-tr foreign-dc-voltage-tg foreign-dc-voltage-rg foreign-ac-voltage-tr foreign-ac-voltage-tg foreign-ac-voltage-rg foreign-ac-voltage-frequency-tr foreign-ac-voltage-frequency-tg foreign-ac-voltage-frequency-rg loop-capacitance-hv-tr loop-resistance-hv-tr loop-resistance-hv-rt four-element-dc-resistance-test-voltage-tr four-element-dc-resistance-test-voltage-rt four-element-dc-resistance-test-voltage-tg four-element-dc-resistance-test-voltage-rg four-element-dc-resistance-test-current-tr four-element-dc-resistance-test-current-rt four-element-dc-resistance-test-current-tg four-element-dc-resistance-test-current-rg loop-resistance-test-voltage-tr loop-resistance-test-voltage-rt three-element-complex-admittance-real-tr three-element-complex-admittance-imaginary-tr three-element-complex-admittance-real-tg three-element-complex-admittance-imaginary-tg three-element-complex-admittance-real-rg three-element-complex-admittance-imaginary-rg loop-complex-admittance-real-hv-tr loop-complex-admittance-imaginary-hv-tr three-element-capacitance-measurement-voltage-tr three-element-capacitance-measurement-voltage-tg three-element-capacitance-measurement-voltage-rg loop-capacitance-measurement-voltage-tr three-element-complex-admittance-measurement-voltage-tr three-element-complex-admittance-measurement-voltage-tg three-element-complex-admittance-measurement-voltage-rg loop-complex-admittance-measurement-voltage-tr unreliability-indicator Defines the Metallic Line Test Physical Medium Dependent (MELT-PMD) measurement parameters.
pmd-profile peak-metallic-voltage-tr pair-identification-tone-frequency pair-identification-tone-timeout maximum-far-end-signature-conductive-voltage minimum-far-end-signature-conductive-voltage measurement-class signal-frequency-for-active-ac-tests Defines the parameters contained in a Physical Medium Dependent (PMD) profile.
pmd-reporting-parameters measurement-frequency foreign-voltage-input-impedance loop-complex-admittance-measurement-voltage unreliability-indicator Defines the Metallic Line Test Physical Medium Dependent (MELT-PMD) reporting parameters.
pmd-status melt-status-c melt-results-c results-timestamp Status parameters for the Physical Medium Dependent (PMD) object.
processing-derived-parameters open-wire-failure-type open-wire-failure-distance short-circuit-failure-type leakage-identification resistive-fault-identification foreign-voltage-type-classification foreign-voltage-level-classification far-end-signature-topology-type-identification cpe-identification-capacitive unreliability-indicator Defines the Metallic Line Test Processing (MELT-P) derived parameters.
processing-profile loop-resistance-classification-threshold loop-parameters-per-unit-length hazardous-dc-voltage-level hazardous-ac-voltage-level foreign-emf-dc-voltage-level foreign-emf-ac-voltage-level system-capacitance-cpe-side Defines the parameters contained in a processing profile.

Objects

Type Key
Mandatory config
Optional config
Not config
Object Type Abstract
melt container Metallic Line Test (MELT) configuration.
   profiles container Configuration profiles.