| melt-pmd-control |
pmd-functions |
Defines the parameters contained in the Physical Medium
Dependent (PMD) control object. |
| melt-pmd-control |
pmd-functions |
Defines the parameters contained in the Physical Medium
Dependent (PMD) control object. |
| pmd-control |
pmd-control request-pmd-function-c |
Physical Medium Dependent (PMD) control functions. |
| pmd-control |
pmd-control request-pmd-function-c |
Physical Medium Dependent (PMD) control functions. |
| pmd-measurement-parameters |
four-element-dc-resistance-tr four-element-dc-resistance-rt four-element-dc-resistance-tg four-element-dc-resistance-rg three-element-capacitance-tr three-element-capacitance-tg three-element-capacitance-rg foreign-dc-voltage-tr foreign-dc-voltage-tg foreign-dc-voltage-rg foreign-ac-voltage-tr foreign-ac-voltage-tg foreign-ac-voltage-rg foreign-ac-voltage-frequency-tr foreign-ac-voltage-frequency-tg foreign-ac-voltage-frequency-rg loop-capacitance-hv-tr loop-resistance-hv-tr loop-resistance-hv-rt four-element-dc-resistance-test-voltage-tr four-element-dc-resistance-test-voltage-rt four-element-dc-resistance-test-voltage-tg four-element-dc-resistance-test-voltage-rg four-element-dc-resistance-test-current-tr four-element-dc-resistance-test-current-rt four-element-dc-resistance-test-current-tg four-element-dc-resistance-test-current-rg loop-resistance-test-voltage-tr loop-resistance-test-voltage-rt three-element-complex-admittance-real-tr three-element-complex-admittance-imaginary-tr three-element-complex-admittance-real-tg three-element-complex-admittance-imaginary-tg three-element-complex-admittance-real-rg three-element-complex-admittance-imaginary-rg loop-complex-admittance-real-hv-tr loop-complex-admittance-imaginary-hv-tr three-element-capacitance-measurement-voltage-tr three-element-capacitance-measurement-voltage-tg three-element-capacitance-measurement-voltage-rg loop-capacitance-measurement-voltage-tr three-element-complex-admittance-measurement-voltage-tr three-element-complex-admittance-measurement-voltage-tg three-element-complex-admittance-measurement-voltage-rg loop-complex-admittance-measurement-voltage-tr unreliability-indicator melt-pmd-measurement-vendor-specific-status |
Defines the Metallic Line Test Physical Medium Dependent
(MELT-PMD) measurement parameters. |
| pmd-measurement-parameters |
four-element-dc-resistance-tr four-element-dc-resistance-rt four-element-dc-resistance-tg four-element-dc-resistance-rg three-element-capacitance-tr three-element-capacitance-tg three-element-capacitance-rg foreign-dc-voltage-tr foreign-dc-voltage-tg foreign-dc-voltage-rg foreign-ac-voltage-tr foreign-ac-voltage-tg foreign-ac-voltage-rg foreign-ac-voltage-frequency-tr foreign-ac-voltage-frequency-tg foreign-ac-voltage-frequency-rg loop-capacitance-hv-tr loop-resistance-hv-tr loop-resistance-hv-rt four-element-dc-resistance-test-voltage-tr four-element-dc-resistance-test-voltage-rt four-element-dc-resistance-test-voltage-tg four-element-dc-resistance-test-voltage-rg four-element-dc-resistance-test-current-tr four-element-dc-resistance-test-current-rt four-element-dc-resistance-test-current-tg four-element-dc-resistance-test-current-rg loop-resistance-test-voltage-tr loop-resistance-test-voltage-rt three-element-complex-admittance-real-tr three-element-complex-admittance-imaginary-tr three-element-complex-admittance-real-tg three-element-complex-admittance-imaginary-tg three-element-complex-admittance-real-rg three-element-complex-admittance-imaginary-rg loop-complex-admittance-real-hv-tr loop-complex-admittance-imaginary-hv-tr three-element-capacitance-measurement-voltage-tr three-element-capacitance-measurement-voltage-tg three-element-capacitance-measurement-voltage-rg loop-capacitance-measurement-voltage-tr three-element-complex-admittance-measurement-voltage-tr three-element-complex-admittance-measurement-voltage-tg three-element-complex-admittance-measurement-voltage-rg loop-complex-admittance-measurement-voltage-tr unreliability-indicator melt-pmd-measurement-vendor-specific-status |
Defines the Metallic Line Test Physical Medium Dependent
(MELT-PMD) measurement parameters. |
| pmd-profile |
peak-metallic-voltage-tr pair-identification-tone-frequency pair-identification-tone-timeout maximum-far-end-signature-conductive-voltage minimum-far-end-signature-conductive-voltage measurement-class signal-frequency-for-active-ac-tests |
Defines the parameters contained in a Physical Medium Dependent
(PMD) profile. |
| pmd-profile |
peak-metallic-voltage-tr pair-identification-tone-frequency pair-identification-tone-timeout maximum-far-end-signature-conductive-voltage minimum-far-end-signature-conductive-voltage measurement-class signal-frequency-for-active-ac-tests |
Defines the parameters contained in a Physical Medium Dependent
(PMD) profile. |
| pmd-reporting-parameters |
measurement-frequency foreign-voltage-input-impedance loop-complex-admittance-measurement-voltage unreliability-indicator melt-pmd-reporting-vendor-specific-status |
Defines the Metallic Line Test Physical Medium Dependent
(MELT-PMD) reporting parameters. |
| pmd-reporting-parameters |
measurement-frequency foreign-voltage-input-impedance loop-complex-admittance-measurement-voltage unreliability-indicator melt-pmd-reporting-vendor-specific-status |
Defines the Metallic Line Test Physical Medium Dependent
(MELT-PMD) reporting parameters. |
| pmd-status |
melt-status-c melt-results-c results-timestamp |
Status parameters for the Physical Medium Dependent (PMD)
object. |
| pmd-status |
melt-status-c melt-results-c results-timestamp |
Status parameters for the Physical Medium Dependent (PMD)
object. |
| processing-derived-parameters |
open-wire-failure-type open-wire-failure-distance short-circuit-failure-type leakage-identification resistive-fault-identification foreign-voltage-type-classification foreign-voltage-level-classification far-end-signature-topology-type-identification cpe-identification-capacitive unreliability-indicator melt-processing-derived-vendor-specific-status |
Defines the Metallic Line Test Processing (MELT-P) derived
parameters. |
| processing-derived-parameters |
open-wire-failure-type open-wire-failure-distance short-circuit-failure-type leakage-identification resistive-fault-identification foreign-voltage-type-classification foreign-voltage-level-classification far-end-signature-topology-type-identification cpe-identification-capacitive unreliability-indicator melt-processing-derived-vendor-specific-status |
Defines the Metallic Line Test Processing (MELT-P) derived
parameters. |
| processing-profile |
loop-resistance-classification-threshold loop-parameters-per-unit-length hazardous-dc-voltage-level hazardous-ac-voltage-level foreign-emf-dc-voltage-level foreign-emf-ac-voltage-level system-capacitance-cpe-side |
Defines the parameters contained in a processing profile. |
| processing-profile |
loop-resistance-classification-threshold loop-parameters-per-unit-length hazardous-dc-voltage-level hazardous-ac-voltage-level foreign-emf-dc-voltage-level foreign-emf-ac-voltage-level system-capacitance-cpe-side |
Defines the parameters contained in a processing profile. |